by Faculty
Filters: author is Chih-Hao Dai2011
"Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors",
APPLIED PHYSICS LETTERS, vol. 99, pp. 012106, 07/2011.
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"On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs",
IEEE Electron Device Letters, 07/2011.
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"Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors",
APPLIED PHYSICS LETTERS, vol. 98, 03/2011.
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2010
"Enhanced gate-induced foating-body effect in PD SOI MOSFET under external mechanical strain",
Surface & Coatings Technology, vol. 205, 06/2010.
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"On the Origin of Hole Valence Band Injection on GIFBE in PD SOI n-MOSFETs",
IEEE Electron Device Letters, 06/2010.
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