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Biblio

TitleAuthorJournalVolpp.Yearsort icon
Bias-dependent amino-acid-induced conductance changes in semi-metallic carbon nanotubes George Abadir; Konrad Walus; David PulfreyNanotechnology212010
Modeling sensing mechanisms in carbon nanotube biosensors George Abadir, Konrad Walus, David PulfreySensors, 2010 IEEE 2010
Basis-Set Choice for DFT/NEGF Simulations of Carbon Nanotubes George Abadir; Konrad Walus; David PulfreyJournal of Computational Electronics81-92009
Analytical Modeling of the Transistor Laser Behnam Faraji; Wei Shi; David Pulfrey; Lukas ChrostowskiJournal of Selected Topics in Quantum Electronics15594-6032009
Comment on "Curvature effects on electronic properties of small radius nanotube" [Appl. Phys. Lett. 91, 033102 (2007)] George Abadir; Konrad Walus; David PulfreyApplied Physics Letters942009
Biomolecular Sensing Using Carbon Nanotubes: A Simulation Study George Abadir;Konrad Walus; Robin Turner;David PulfreyInternational Journal of High Speed Electronics and Systems18879-8872008
Common-Emitter and Common-Base Small-Signal Operation of the Transistor Laser Behnam Faraji; Wei Shi; David L. Pulfrey; Lukas ChrostowskiApplied Physics Letters931435032008
Effect of Single-Biomolecule Adsorption on the Electrical Properties of Short Carbon Nanotubes George Abadir; Konrad Walus; Robin Turner; David PulfreyIEEE Nanotechnolgy 2008230-2322008
Small-signal Modeling of the Transistor Laser in Common-Emitter and Common-Base Configurations Behnam Faraji; Wei Shi; David L. Pulfrey; Lukas ChrostowskiIEEE Lasers and Electro-Optics Society, 21st Annual Meeting681-6822008
Bipolar conduction and drain-induced barrier thinning in carbon nanotube FETs Clifford, J. ; John, D.L. ; Pulfrey, D.L.IEEE Trans. Nanotechnol. (USA)2181 - 52003
Electrostatics of coaxial Schottky-barrier nanotube field-effect transistors John, D.L. ; Castro, L.C. ; Clifford, J. ; Pulfrey, D.L.IEEE Trans. Nanotechnol. (USA)2175 - 802003
Ionic current as a function of field in the oxide during plasma anodization of tantalum and niobium Lee, W.L. ; Olive, G. ; Pulfrey, D.L. ; Young, L.J. Electrochem. Soc. (USA)1171172 - 61970
Dielectric properties of Ta<sub>2</sub>O<sub>5</sub> thin films Pulfrey, D.L. ; Wilcox, P.S. ; Young, L.J. Appl. Phys. (USA)403891 - 81969